Marques de sa, J. P. <br/><br/>
Pattern recognition :  concepts, methods and applications / 

 - New York :  Springer-Verlag Berlin Heidelberg,  c2001. 
 - xix, 318 p. :  ill. ;  23 cm. 
<br/><br/> Includes index. 
<br/><br/><label>ISBN: </label>9783642626777 
<br/><br/><label>LC Class. No.: </label>22757-22761 
<br/><br/><label>Dewey Class. No.: </label>152.1423  / MAR